Anomalous X-Ray Scattering for Materials Characterization: Atomic-Scale Structure Determination (Softcover Reprint of the Original 1st 2002)

Contributor(s): Waseda, Yoshio (Author)

ISBN: 9783662146378

Publisher: Springer

Paperback

$219.99

Digicover (1-4 copies)

$232.94 (Final Price)

Readerbound (5-99 copies)

$231.74 (100+ copies: $230.99)

List/retail price:

$219.99

Pub Date: October 3, 2013

Dewey: 548.83

Lexile Code: 0000

Target Age Group: NA to NA

Physical Info: 0.49" H x 9.21" L x 6.14" W ( 0.73 lbs) 214 pages

BISAC Categories:

Series: Springer Tracts in Modern Physics

Descriptions, Reviews, etc.

Description: A new materials characterization methods, anomalous X-ray scattering, is presented in this book.

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