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Anomalous X-Ray Scattering for Materials Characterization: Atomic-Scale Structure Determination (2002)

Contributor(s): Waseda, Yoshio (Author)

ISBN: 9783540434436

Publisher: Springer

Hardcover
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Pub Date: September 11, 2002

Dewey: 548.83

LCCN: 2002030444

Lexile Code: 0000

Features: Illustrated

Target Age Group: NA to NA

Physical Info: 0.56" H x 9.21" L x 6.14" W ( 1.11 lbs) 214 pages

Series: Springer Tracts in Modern Physics

Descriptions, Reviews, etc.

Description: A new materials characterization methods, anomalous X-ray scattering, is presented in this book.

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