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Adv Math & Comp Tool Metrol VIII

Contributor(s): Pavese Franco (Author)

ISBN: 9789812839510

Publisher: World Scientific Publishing Company

Hardcover
$198.00
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Pub Date: April 1, 2009

Dewey: 530.8

LCCN: 2009001775

Lexile Code: 0000

Features: Bibliography, Index, Table of Contents

Target Age Group: NA to NA

Physical Info: 1.10" H x 9.00" L x 6.10" W ( 1.60 lbs) 424 pages

BISAC Categories:

Mathematics | Measurement | PreCalculus

Series: Advances in Math for Applied Sciences

Descriptions, Reviews, etc.

Description: The main theme of the AMCTM 2008 conference, reinforced by the establishment of IMEKO TC21, was to provide a central opportunity for the metrology and testing community worldwide to engage with applied mathematicians, statisticians and software engineers working in the relevant fields.This review volume consists of reviewed papers prepared on the basis of the oral and poster presentations of the Conference participants. It covers all the general matters of advanced statistical modeling (e.g. uncertainty evaluation, experimental design, optimization, data analysis and applications, multiple measurands, correlation, etc.), metrology software (e.g. engineering aspects, requirements or specification, risk assessment, software development, software examination, software tools for data analysis, visualization, experiment control, best practice, standards, etc.), numerical methods (e.g. numerical data analysis, numerical simulations, inverse problems, uncertainty evaluation of numerical algorithms, applications, etc.), and data fusion techniques and design and analysis of inter-laboratory comparisons.

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