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Noncontact Atomic Force Microscopy: Volume 2 (2009)

Contributor(s): Morita, Seizo (Editor), Giessibl, Franz J (Editor), Wiesendanger, Roland (Editor)

ISBN: 9783642014949

Publisher: Springer

Hardcover
$249.99
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Pub Date: October 1, 2009

Dewey: 620.5

Lexile Code: 0000

Target Age Group: NA to NA

Physical Info: 1.00" H x 9.20" L x 6.10" W ( 1.55 lbs) 401 pages

Series: Nanoscience and Technology

Descriptions, Reviews, etc.

Description:

This report on scanning probe microscopy covers the latest in many related topics such as force spectroscopy and mapping with atomic resolution, atomic manipulation, magnetic exchange force microscopy, atomic and molecular imaging in liquids, and much more.

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