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Quantum Metrology, Imaging, and Communication (2017)

Contributor(s): Simon, David S (Author), Jaeger, Gregg (Author), Sergienko, Alexander V (Author)

ISBN: 9783319465494

Publisher: Springer

Hardcover
$169.99
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Pub Date: December 8, 2016

Dewey: 530.12

Lexile Code: 0000

Features: Illustrated

Target Age Group: NA to NA

Physical Info: 0.69" H x 9.21" L x 6.14" W ( 1.28 lbs) 273 pages

Series: Quantum Science and Technology

Descriptions, Reviews, etc.

Description: This book describes the experimental and theoretical bases for the development of specifically quantum-mechanical approaches to metrology, imaging, and communication. In particular, it presents novel techniques developed over the last two decades and explicates them both theoretically and by reference to experiments which demonstrate their principles in practice. The particular techniques explored include two-photon interferometry, two-photon optical aberration and dispersion cancellation, lithography, microscopy, and cryptography.

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