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Ion Beam Induced Defects and Their Effects in Oxide Materials (2022)

Contributor(s): Kumar, Parmod (Author), Singh, Jitendra Pal (Author), Kumar, Vinod (Author), Asokan, K (Author)

ISBN: 9783030938611

Publisher: Springer

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Pub Date: February 24, 2022

Lexile Code: 0000

Features: Illustrated

Target Age Group: NA to NA

Physical Info: 0.15" H x 9.21" L x 6.14" W ( 0.25 lbs) 61 pages

Series: Springerbriefs in Physics

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Description:

This book provides an overview of the applications of ion beam techniques in oxide materials. Oxide materials exhibit defect-induced physical properties relevant to applications in sensing, optoelectronics and spintronics. Defects in these oxide materials also lead to magnetism in non-magnetic materials or to a change of magnetic ordering in magnetic materials. Thus, an understanding of defects is of immense importance. To date, ion beam tools are considered the most effective techniques for producing controlled defects in these oxides. This book will detail the ion beam tools utilized for creating defects in oxides.

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