Book Cover

Silver Metallization: Stability and Reliability (2008)

Contributor(s): Adams, Daniel (Author), Alford, Terry L (Author), Mayer, James W (Author)

ISBN: 9781848000261

Publisher: Springer

Hardcover
$109.99
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Pub Date: October 19, 2007

Dewey: 621.3815

LCCN: 2007932625

Lexile Code: 0000

Features: Bibliography, Illustrated, Index, Table of Contents

Target Age Group: NA to NA

Physical Info: 0.50" H x 9.40" L x 6.20" W ( 0.70 lbs) 123 pages

Series: Engineering Materials and Processes

Descriptions, Reviews, etc.

Description:

Anyone involved in circuit technology will find this an absolute must-read. It's the first book to discuss the current understanding of silver metallization and its potential as a future interconnect material for integrated circuit technology.

Review Quotes:

From the reviews:

"This book is aimed at addressing and reviewing the engineering aspects of improving the thermal and electrical stability of silver with a view to use as an interconnect material in integrated circuits. ... this book can provide a quick overview of the state of the art, current trends and hurdles yet to be overcome." (Contemporary Physics, Vol. 51 (6), 2010)

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