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Mentally Defective Children

Contributor(s): Simon, Theodore (Author), Binet, Alfred (Author)

ISBN: 9781516890415

Publisher: Createspace Independent Publishing Platform

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Pub Date: August 13, 2015

Lexile Code: 0000

Target Age Group: NA to NA

Physical Info: 0.23" H x 9.02" L x 5.98" W ( 0.35 lbs) 112 pages

BISAC Categories:

Fiction | Classics

Descriptions, Reviews, etc.

Description: The Binet-Simon tests of children's intelligence have been the subject of much discussion during the past few years, both in this country and in America. Much of this discussion seems to have been carried on, at times, without any knowledge of the original aim or purpose for which these tests were devised, and as if, so to speak, they were invented as a means for ascertaining the relative intellectual powers of all children, and so of affording to the teacher a ready and sure means of accurately classifying and grading the children under his charge.

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