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Atom Probe Microscopy (2012)

Contributor(s): Gault, Baptiste (Author), Moody, Michael P (Author), Cairney, Julie M (Author), Ringer, Simon P (Author)

ISBN: 9781489989390

Publisher: Springer

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Pub Date: June 11, 2014

Dewey: 502.82

Lexile Code: 0000

Features: Illustrated, Maps

Target Age Group: NA to NA

Physical Info: 0.86" H x 9.21" L x 6.14" W ( 1.30 lbs) 396 pages

Series: Springer Materials Science

Descriptions, Reviews, etc.

Description:

This uniquely powerful microscopy technique has seen major innovations in the last decade, including pulsed-laser-assisted evaporation. As the most practical, up-to-date critical review of the field, this volume includes examples of APM from materials science.

Review Quotes:

"Atom Probe Microscopy ... provides a much needed update on the topic and introduces the broader scientific community to this developing technique. ... this book fills a critical need for a revised and updated text that can educate and motivate new researchers and also provide up-to-date references for active practitioners. The balanced delivery of instructional and reference material, in tandem with excellent graphical examples, make this book a flexible text for any atom probe laboratory." (Daniel K. Schreiber, Analytical and Bioanalytical Chemistry, Vol.407, 2015)

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