Description:
This book delivers timely coverage of component- and system-level electrostatic discharge (ESD) protection for semiconductor devices and integrated circuits. Illustrated with tables, figures, and case studies, the text brings together contributions from internationally respected researchers and engineers with expertise in ESD design, optimization, modeling, simulation, and characterization. It provides readers with a deeper understanding of ESD events, ESD protection design principles, important aspects of the modeling and simulation of ESD protection solutions, and vital processes including Si CMOS, Si BCD, Si SOI, and GaN technologies.
Review Quotes:
"... very timely, as the contributors are the experts within their respective fields and industries. ... covers important applications of electrostatic discharge (ESD) protection circuits like automotive integrated circuits, GaN-based electronics, and advanced foundry processes. I strongly recommend this book to circuit designers and failure and analysis engineers."
--Kin-Leong Pey, Professor and Associate Provost, Singapore University of Technology and Design
"An excellent team of experienced authors who have written and presented extensively on ESD protection of silicon chips, including tutorials and short courses at various conferences, are sure to come up with an outstanding book, both to serve as an introduction to those new in the field and to provide timely updates to those already working in it."
--Dimitris E. Ioannou, George Mason University, Fairfax, Virginia, USA
"... enters into details about component-level protection, and this is a merit of the book because several books investigate solutions at the system level, but very few do so at the component level. ... a valuable resource to industrial designers of components based on complementary metal-oxide semiconductor (CMOS) technology and electronic equipment, as well as to development engineers. It will be of interest to managers and designers of consumer electronics and to researchers in electronics."
--Spartaco Caniggia, Signal Integrity (SI) and Electromagnetic Compatibility (EMC) Consultant
"Edited by Dr. Juin J. Liou in collaboration with Krzysztof Iniewski and 20 other editors, Electrostatic Discharge Protection: Advances and Applications brings together a team of experienced and well-respected researchers and engineers from around the world, representing universities and semiconductor industries, with expertise in electrostatic discharge (ESD). This book truly represents the hall of fame of ESD. This book is an A-to-Z complete guide for the ASIC ESD designer; it includes charts, tables, test procedures, and standards, making it a must-have for every ESD designer."
--IEEE Microwave Magazine, August 2016