Description:
The first book to focus on logo recognition, this text presents a new logo recognition system based on line pattern features. To achieve the desired accuracy and efficiency, the system employs a conceptually simple three-stage hierarchy that includes polygonal approximation, indexing, and matching. In the first stage, raw logos are transformed into normalized line segment maps. In the second stage, effective line pattern features are used to index the database in order to generate a moderate number of likely models. In the third stage, an improved Line Segment Hausdorff Distance (LHD) measure screens and generates the best matches.
Review Quotes:
"I was inspired by this book project at the very beginning; now the book appears to be even a better idea when I really have it in hand. The resulting appraisal is thoughtful, creative, and comprehensive."--From the Foreword by Professor Xiaoli Li, College of Information Science and Technology, Beijing Normal University
"... Overall the book is well written and easy to follow ... understandable and well formulated. I recommend it to readers willing to learn about logo recognition systems and potential commercial applications of shape recognition tools."--Journal of Intelligent and Robotic Systems