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Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions

Contributor(s): Kumar, Ch Sateesh (Author), Singh, M Muralidhar (Author), Krishna, Ram (Author)

ISBN: 9781032375106

Publisher: CRC Press

Hardcover
$165.00
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Pub Date: May 4, 2023

Lexile Code: 0000

Features: Illustrated

Target Age Group: NA to NA

Physical Info: 0.38" H x 9.21" L x 6.14" W ( 0.84 lbs) 130 pages

Series: Advanced Materials Processing and Manufacturing

Descriptions, Reviews, etc.

Description: The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth.

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