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Introduction to the Characterization of Residual Stress by Neutron Diffraction

Contributor(s): Hutchings, M T (Author), Withers, P J (Author), Holden, T M (Author), Lorentzen, Torben (Author)

ISBN: 9780415310000

Publisher: CRC Press

Hardcover
$225.00
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Pub Date: February 1, 2005

Dewey: 620.11230287

LCCN: 2004054549

Lexile Code: 0000

Features: Bibliography, Glossary, Index

Target Age Group: NA to NA

Physical Info: 1.08" H x 9.52" L x 6.66" W ( 1.56 lbs) 420 pages

Descriptions, Reviews, etc.

Description: Since the 1980s, the field of neutron diffraction has grown significantly. Introduction to Characterization of Residual Stress by Neutron Diffraction offers a comprehensive overview that serves as a starting point for people gaining interest in the subject, whether for scientific or engineering applications. Written by experts in the field, this exceptional book includes descriptions of the basic scattering properties of neutrons and of quantities of direct relevance for a thorough understanding of matters that affect the recorded data. The book also covers the analysis and interpretation of measured data, the conversion of strains to stresses, and theoretical treatments of polycrystal deformation.

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