Description:
Microscopy Methods in Nanomaterials Characterization fills an important gap in the literature with a detailed look at microscopic and X-ray based characterization of nanomaterials. These microscopic techniques are used for the determination of surface morphology and the dispersion characteristics of nanomaterials.
This book deals with the detailed discussion of these aspects, and will provide the reader with a fundamental understanding of morphological tools, such as instrumentation, sample preparation and different kinds of analyses, etc. In addition, it covers the latest developments and trends morphological characterization using a variety of microscopes.
Materials scientists, materials engineers and scientists in related disciplines, including chemistry and physics, will find this to be a detailed, method-orientated guide to microscopy methods of nanocharacterization.
Brief description: Prof. Ajesh K. Zachariah is currently working as Assistant Professor in the Department of Chemistry, Mar Thoma College, Tiruvalla. He had done Doctoral Research in Polymer Chemistry at School of Chemical Sciences, Mahatma Gandhi University, Kottayam, Kerala, India. He has ten years' research experience in nanomaterials and characterization. Expert in sophisticated analytical techniques such as Atomic Force Microscopy (AFM), X ray diffraction Technique (XRD), Gas Permeability Tester, Dynamic Mechanical Analyser (DMA), Rubber Process Analyser (RPA)and Oscillating Disc Rheometer (ODR). Published nine internationally cited articles, two international books and applied one Indian patent. He presented articles in different national and international conferences. He bagged Young Technological Innovation (GYTI) Award 2013, the meritorious research scholar award from UGC, India in 2009 and young researcher award in Nanosat-2010. His research areas are nanomaterial, naocomposites, elastomer-elastomer blend systems, sensors, membranes, computational chemistry and environmental chemistry.