Description: A powerful and relatively new method for extracting detailed crystal structural information from X-ray and neutron powder diffraction data, the Rietveld method attracts a great deal of interest from researchers in physics, chemistry, materials science, and crystallography. Now available in paperback, this book comprises chapters from international researchers on all aspects of this important technique. It will be of great interest to all researchers in the fields, as well as graduate students seeking a solid introduction and comprehensive survey.
Review Quotes: "Each of the chapters has its own comprehensive list of references..." --Materials Characterization